Join the 9th IEEE MetroInd4.0 & IoT to shape the future of measurement for smart, connected industry.
Seeking collaborator:
Seeking expertise:
From digital twins and edge AI to cloud metrology and interoperable sensors, MetroInd4.0 & IoT brings together the global community pushing the boundaries of measurement in Industry 4.0 and the Industrial Internet of Things.
Why attend
Meet researchers, engineers, and industry leaders working on smart manufacturing, cyber‑physical systems, and IIoT.
Discover advances in sensors, data acquisition, AI‑driven analytics, and standards for traceable, real‑time industrial measurements.
Explore special sessions that deep‑dive into hot topics and create fertile ground for new collaborations and project ideas.
For authors and innovators
Submit a 4–5 page extended abstract and get your work evaluated by an international technical program committee.
Accepted papers are planned for publication in IEEE Xplore, with the opportunity to extend selected works into journal articles.
Early‑career researchers and students are strongly encouraged to contribute and connect with mentors and potential partners.
Call for papers is open now – submit your extended abstract and join the community building trustworthy measurements for the factories and infrastructures of tomorrow.
Visit the website for more information: https://www.metroind40iot.org/